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Micro-analysis

Microprobe - SEM

Fine analysis of materials is undertaken using a CAMECA Camebax SX50 micro-probe and SX100 computer.

Spectrum provided by the micro-probe

The Camebax SX50 micro-probe is used both as a scanning electron microscope (SEM), and as a selectable wavelength micro-analysis system (WDS system). It can be used to analyse all elements beyond boron, with a high sensitivity ranging from a few ppm to 100%. The beam is adjustable between 100 pA and 5 µA.

Ductile fracture in ductile cast iron

Electron microscope examination is used:

To study fracture surfaces, to identify the crack initiation point of a part following fatigue failure,
To check the appearance of the surface of parts,
To characterise recycled sand.

Segregation of molybdenum in steel

Micro-probe analyses are undertaken either at specific points by choosing the impact points (for identification of constituents), or scanning (to study micro-segregation).

Labelling of spheroids in spheroidal graphite cast iron

The applications are numerous:

Carbon and nitrogen content to check carburising or nitriding processes
Measurement of the thickness of thin layers (0.1 to 2 µm)
Images of the distribution of elements, in order to quantify the degree of segregation
Identification of constituents
Characterisation of inclusions

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