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X-ray diffraction

X-ray diffraction is used to identify crystallised products by studying the size and shape of the elementary crystals:

Identification of the oxides formed at high temperature or in aqueous media (e.g. pipes)
Identification of constituents of soil or clay (e.g. characterisation of bentonite)

Siemens diffractometer

Goniometer and rotary sample holder

Studying the shape of the rays is used to identify the micro-stress condition and the size of the crystallites. The variation in the position of the rays provides an indication of the surface stresses present.

Measurement of the brightness of the rays is used to determine the proportions of the crystallised phases present.

Two applications are available from this:

Determination of the residual austenite,
Measurement of the silica present in the atmosphere of work areas.

Determination of austenite

We hold COFRAC approval for the determination of silica and we regularly take part in inter-laboratory comparisons, in which we are invariably well placed.

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