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Chemical composition analysis


Regarding chemical composition analysis, the CTIF laboratories provide a wide range of services extending from the determination of trace elements to the determination of the constituents of alloys and the analysis of gases. It is also possible to undertake spectrometric analyses on solid materials and by the humid media method.



X-ray fluorescence spectrometer




CTIF possesses a range of scintillation and light discharge spectrometers, including a One Spark providing an unlimited choice of analysis wavelengths. The flexibility available through this innovative technology enables the analysis of a broad range of metallic materials.


In parallel with this, according to the elements and the matrices present, plasma source emission spectrometry may also be used, both for analysing elements which are present in very low quantities as well as for analysing the major constituent elements.




Finally, other spectrometers, such as atomic absorption or molecular absorption spectrometers, are employed for determining elements which are present in small or extremely small concentrations.

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